Journal: Technometrics

Volume 51, Issue 1

1 -- 13Ying Shi, Luis A. Escobar, William Q. Meeker. Accelerated Destructive Degradation Test Planning
14 -- 24Jerald F. Lawless, Martin Crowder, Ker-Ai Lee. Analysis of Reliability and Warranty Claims in Products With Age and Usage Scales
25 -- 33Hsiuying Wang, Fugee Tsung. Tolerance Intervals With Improved Coverage Probabilities for Binomial and Poisson Variables
34 -- 46Jung Jin Cho, Yong Chen, Yu Ding. Calculating the Breakdown Point of Sparse Linear Models
47 -- 55Carla A. Vivacqua, Søren Bisgaard. Post-Fractionated Strip-Block Designs
56 -- 65Timothy J. Robinson, Christine M. Anderson-Cook, Michael S. Hamada. Bayesian Analysis of Split-Plot Experiments With Nonnormal Responses for Evaluating Nonstandard Performance Criteria
66 -- 74Chen-Tuo Liao, Feng-Shun Chai. Design and Analysis of Two-Level Factorial Experiments With Partial Replication
75 -- 87Christine M. Anderson-Cook, Connie M. Borror, Bradley Jones. Graphical Tools for Assessing the Sensitivity of Response Surface Designs to Model Misspecification
88 -- 95Christopher M. Gotwalt, Bradley A. Jones, David M. Steinberg. Fast Computation of Designs Robust to Parameter Uncertainty for Nonlinear Settings
96 -- 97Peter Goos, James M. Lucas. Letter to the Editor