Journal: Technometrics

Volume 51, Issue 4

349 -- 0David M. Steinberg. Editorial Announcement
350 -- 352David M. Steinberg. Editor's Report
353 -- 0M. J. Bayarri, Jim Berger, David M. Steinberg. Special Issue on Computer Modeling
354 -- 365Ying Hung, V. Roshan Joseph, Shreyes N. Melkote. Design and Analysis of Computer Experiments With Branching and Nested Factors
366 -- 376Jason L. Loeppky, Jerome Sacks, William J. Welch. Choosing the Sample Size of a Computer Experiment: A Practical Guide
377 -- 388Jonathan A. Cumming, Michael Goldstein. Small Sample Bayesian Designs for Complex High-Dimensional Models Based on Information Gained Using Fast Approximations
389 -- 401Matthew Taddy, Herbert K. H. Lee, Genetha A. Gray, Joshua D. Griffin. Bayesian Guided Pattern Search for Robust Local Optimization
402 -- 413M. J. Bayarri, James O. Berger, Eliza S. Calder, Keith Dalbey, Simon Lunagomez, Abani K. Patra, E. Bruce Pitman, Elaine T. Spiller, Robert L. Wolpert. Using Statistical and Computer Models to Quantify Volcanic Hazards
414 -- 424Jonathan Rougier, Serge Guillas, Astrid Maute, Arthur D. Richmond. Expert Knowledge and Multivariate Emulation: The Thermosphere-Ionosphere Electrodynamics General Circulation Model (TIE-GCM)
425 -- 438Leonardo S. Bastos, Anthony O'Hagan. Diagnostics for Gaussian Process Emulators
439 -- 451Shuchun Wang, Wei Chen, Kwok-Leung Tsui. Bayesian Validation of Computer Models
452 -- 463Sébastien Da Veiga, François Wahl, Fabrice Gamboa. Local Polynomial Estimation for Sensitivity Analysis on Models With Correlated Inputs
464 -- 474Gang Han, Thomas J. Santner, Jeremy J. Rawlinson. Simultaneous Determination of Tuning and Calibration Parameters for Computer Experiments
475 -- 476Robert Mee. Letter to the Editor
477 -- 478Chen-Tuo Liao, Feng-Shun Chai. Response

Volume 51, Issue 3

227 -- 238Haipeng Shen. On Modeling and Forecasting Time Series of Smooth Curves
239 -- 249Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner. Two-Stage Leveraged Measurement System Assessment
250 -- 261Lulu Kang, V. Roshan Joseph. Bayesian Optimal Single Arrays for Robust Parameter Design
262 -- 277Hongquan Xu. Algorithmic Construction of Efficient Fractional Factorial Designs With Large Run Sizes
278 -- 288Gang Han, Thomas J. Santner, William I. Notz, Donald L. Bartel. Prediction for Computer Experiments Having Quantitative and Qualitative Input Variables
289 -- 305Jong-Hoon Joo, Peihua Qiu. Jump Detection in a Regression Curve and Its Derivative
306 -- 315Michael J. Brusco, Douglas Steinley, J. Dennis Cradit. An Exact Algorithm for Hierarchically Well-Formulated Subsets in Second-Order Polynomial Regression
316 -- 325Jin Zhang, Michael A. Stephens. A New and Efficient Estimation Method for the Generalized Pareto Distribution
326 -- 334Dulal K. Bhaumik, Kush Kapur, Robert D. Gibbons. Testing Parameters of a Gamma Distribution for Small Samples
335 -- 338Sheng-Tsaing Tseng, Bo-Yan Jou. A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller"

Volume 51, Issue 2

109 -- 0David M. Steinberg. Editor's Note: Improved Web Site With Supplemental Materials
110 -- 120Brian J. Reich, Curtis B. Storlie, Howard D. Bondell. Variable Selection in Bayesian Smoothing Spline ANOVA Models: Application to Deterministic Computer Codes
121 -- 129Jeremy E. Oakley. Decision-Theoretic Sensitivity Analysis for Complex Computer Models
130 -- 145Robert B. Gramacy, Herbert K. H. Lee. Adaptive Design and Analysis of Supercomputer Experiments
146 -- 161William Q. Meeker, Luis A. Escobar, Yili Hong. Using Accelerated Life Tests Results to Predict Product Field Reliability
162 -- 172Baibing Li. A Non-Gaussian Kalman Filter With Application to the Estimation of Vehicular Speed
173 -- 185Milan Zukovic, Dionissios T. Hristopulos. The Method of Normalized Correlations: A Fast Parameter Estimation Method for Random Processes and Isotropic Random Fields That Focuses on Short-Range Dependence
186 -- 205Yanting Li, Fugee Tsung. False Discovery Rate-Adjusted Charting Schemes for Multistage Process Monitoring and Fault Identification
206 -- 214Max D. Morris, Brad Dilts, Stuart J. Birrell, Philip M. Dixon. Composite Response Surface Designs for Factors With Jointly Symmetric Effects

Volume 51, Issue 1

1 -- 13Ying Shi, Luis A. Escobar, William Q. Meeker. Accelerated Destructive Degradation Test Planning
14 -- 24Jerald F. Lawless, Martin Crowder, Ker-Ai Lee. Analysis of Reliability and Warranty Claims in Products With Age and Usage Scales
25 -- 33Hsiuying Wang, Fugee Tsung. Tolerance Intervals With Improved Coverage Probabilities for Binomial and Poisson Variables
34 -- 46Jung Jin Cho, Yong Chen, Yu Ding. Calculating the Breakdown Point of Sparse Linear Models
47 -- 55Carla A. Vivacqua, Søren Bisgaard. Post-Fractionated Strip-Block Designs
56 -- 65Timothy J. Robinson, Christine M. Anderson-Cook, Michael S. Hamada. Bayesian Analysis of Split-Plot Experiments With Nonnormal Responses for Evaluating Nonstandard Performance Criteria
66 -- 74Chen-Tuo Liao, Feng-Shun Chai. Design and Analysis of Two-Level Factorial Experiments With Partial Replication
75 -- 87Christine M. Anderson-Cook, Connie M. Borror, Bradley Jones. Graphical Tools for Assessing the Sensitivity of Response Surface Designs to Model Misspecification
88 -- 95Christopher M. Gotwalt, Bradley A. Jones, David M. Steinberg. Fast Computation of Designs Robust to Parameter Uncertainty for Nonlinear Settings
96 -- 97Peter Goos, James M. Lucas. Letter to the Editor