Journal: IEEE T. Instrumentation and Measurement

Volume 53, Issue 2

238 -- 242Ger de Graaf, Reinoud F. Wolffenbuttel. Illumination source identification using a CMOS optical microsystem
243 -- 250Michael Solomou, David Rees, Neophytos Chiras. Frequency domain analysis of nonlinear systems driven by multiharmonic signals
251 -- 258Riccardo Bodega, Peter H. F. Morshuis, Massimo Lazzaroni, Frank J. Wester. PD recurrence in cavities at different energizing methods
259 -- 265Leszek R. Jaroszewicz, Pawel Marc. Fiber-optic interferometric polarization analyzer: new approach to polarization analysis
266 -- 270S. Brigati, F. Francesconi, Piero Malcovati, Franco Maloberti. A fourth-order single-bit switched-capacitor Σ-Δ modulator for distributed sensor applications
271 -- 276Gerard N. Stenbakken, Hung-kung Liu. Empirical modeling methods using partial data
277 -- 283Filippo Mondinelli, Zsolt Miklós Kovács-Vajna. Self-localizing sensor network architectures
284 -- 292Albert Saravi, Peter D. Lawrence, Frank Lam. Implementation of a mechanics-based system for estimating the strength of timber
293 -- 299Djuro G. Zrilic, Nebojsa U. Pjevalica. Frequency deviation measurement based on two-arm Δ-Σ modulated bridge
300 -- 307Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi. Analysis and measurement of fault coverage in a combined ATE and BIST environment
308 -- 317Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi. Using data compression in automatic test equipment for system-on-chip testing
318 -- 329Dan Zhao, Shambhu J. Upadhyaya. A generic resource distribution and test scheduling scheme for embedded core-based SoCs
330 -- 334Yongjoon Cho, Sehun Rhee. Quality estimation of resistance spot welding by using pattern recognition with neural networks
335 -- 340Miodrag D. Kusljevic. A simple recursive algorithm for frequency estimation
341 -- 350Domenico Mirri, Fabio Filicori, Gaetano Iuculano, Gaetano Pasini. A nonlinear dynamic model for performance analysis of large-signal amplifiers in communication systems
351 -- 356Jyh-Yeong Chang, Jia-Lin Chen. Classifier-augmented median filters for image restoration
357 -- 367Masaru Fukushi, Susumu Horiguchi. A self-reconfigurable hardware architecture for mesh arrays using single/double vertical track switches
368 -- 377Xiaoling Sun, Pieter M. Trouborst. A unified global and local interconnect test scheme for Xilinx XC4000 FPGAs
378 -- 383Herman P. Jr. Lima, Germano P. Guedes, Ademarlaudo F. Barbosa, José Manoel de Seixas. A fast multichannel analyzer for radiation detection applications
384 -- 391Darko Vyroubal. Impedance of the eddy-current displacement probe: the transformer model
392 -- 397Pascal Leuchtmann, Jürg Rüfenacht. On the calculation of the electrical properties of precision coaxial lines
398 -- 405Marcel A. Kossel, Pascal Leuchtmann, Jürg Rüfenacht. Traceable correction method for complex reflection coefficient using calculable air line impedance standards
406 -- 415Shanup Peer, Kimberly E. Kurtis, Reza Zoughi. An electromagnetic model for evaluating temporal water content distribution and movement in cyclically soaked mortar
416 -- 422Richard C. Kavanagh, Alan Jones. New low-cost technique for accurate surface velocity measurement of a rotating drum
423 -- 430Jose Miguel Dias Pereira, P. M. B. Silva Girao, António Manuel da Cruz Serra. An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems
431 -- 436Levent Eren, Michael J. Devaney. Bearing damage detection via wavelet packet decomposition of the stator current
437 -- 443Philippe Lavoie, Dan Ionescu, Emil M. Petriu. 3D object model recovery from 2D images using structured light
444 -- 447Marko Petkovsek, Janez Nastran, Peter Zajec, France Pavlovcic, Danijel Voncina. Soft-magnetic ring core measuring system with a decreased number of primary and secondary winding turns
448 -- 456Benoit Provost, Edgar Sánchez-Sinencio. A practical self-calibration scheme implementation for pipeline ADC
457 -- 465J. Antoni, P. Wagstaff, Jean-Charles Henrio. H::α:: - a consistent estimator for frequency response functions with input and output noise
466 -- 471Takayuki Kurosu, Yasuhiro Fukuyama, Yasuki Koga, Kentaro Abe. Preliminary evaluation of the Cs atomic fountain frequency standard at NMIJ/AIST
472 -- 484Anthony Faria Vaz, Rafael Bravo. Smart piezoelectric film sensors for structural control
485 -- 492Valerio Bernasconi, Loris Bollea, Alessandro Breda, Pasquale Daponte, Gianluca Maroncelli, Sergio Rapuano. A TFR-based method for the quality assessment of UMTS signals: an application on the First Italian Experimental Network
498 -- 506Clemens Icheln, Joonas Krogerus, Pertti Vainikainen. Use of balun chokes in small-antenna radiation measurements
507 -- 513Bruno Andò, Mauro Coltelli, Marilena Sambataro. A measurement tool for investigating cooling lava properties
514 -- 523Carlo F. M. Carobbi, Luigi M. Millanta. Analysis of the common-mode rejection in the measurement and generation of magnetic fields using loop probes
524 -- 536Christian Kargel, Gernot Plevnik, Birgit Trummer, Michael F. Insana. Doppler ultrasound systems designed for tumor blood flow imaging
537 -- 545Gabriele D Antona. Measurement data processing using random matrices: a generalized formula for the propagation of uncertainty
546 -- 556Fenglei Liu, Christopher J. Zarowski. Detection and location of connection splice events in fiber optics given noisy OTDR data. Part II. R1MSDE method
557 -- 560Alessio Carullo, Marco Parvis, Alberto Vallan. A traveling standard for the calibration of data acquisition boards
561 -- 565Jean-Marie Janik, Daniel Bloyet. Timing uncertainties of A/D converters: theoretical study and experiments
566 -- 570Michaël Demeyere, Christian Eugène. Measurement of cylindrical objects by laser telemetry: a generalization to a randomly tilted cylinder
571 -- 574Marcello Marano, Gianluca Galzerano, Cesare Svelto, Paolo Laporta. Frequency stabilized Tm-Ho: YAG laser by locking to H:::79:::Br and CO::2:: transitions at around 2.09 μm
575 -- 580Stevan M. Berber. An automated method for BER characteristics measurement
581 -- 587Stephan Biber, Oleg Cojocari, Günther Rehm, Bastian Mottet, Manuel Rodríguez-Gironés, Lorenz-Peter Schmidt, Hans L. Hartnagel. A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes
588 -- 596P. K. Dash, M. V. Chilukuri. Hybrid S-transform and Kalman filtering approach for detection and measurement of short duration disturbances in power networks
602 -- 611Jeongjin Roh, Jacob A. Abraham. Subband filtering for time and frequency analysis of mixed-signal circuit testing
619 -- 0Wojciech Wiatr. Comments on Cryogenic noise parameter measurements of microwave devices