Journal: IEEE T. Instrumentation and Measurement

Volume 68, Issue 6

1652 -- 0Djamel Allal, Sophie Djordjevic, Ron Goldfarb, Michael Lombardi. Conference on Precision Electromagnetic Measurements (CPEM 2018)
1653 -- 1658Ernest Houtzager, Ralph Hornecker, Gert Rietveld. Compact Distributed Digitizers With Metrological Precision
1659 -- 1665Jerzy Augustyn, Marian Kampik. Improved Sine-Fitting Algorithms for Measurements of Complex Ratio of AC Voltages by Asynchronous Sequential Sampling
1666 -- 1670Wei Yan, Wei Zhao, Yi Li. Effect of Step Response Measurement Arrangement on the Correction of Ultrahigh-Voltage Lightning Impulse Dividers
1671 -- 1679Shuangyong Zhuang, Wei Zhao, Ren Wang, Qing Wang, Songling Huang. New Measurement Algorithm for Supraharmonics Based on Multiple Measurement Vectors Model and Orthogonal Matching Pursuit
1680 -- 1687Eddy So, Rob Verhoeven, Bart Simons, Harold V. Parks, Dave Angelo. A High-Precision Current Transformer for Loss Measurements of EHV Shunt Reactors
1688 -- 1695Paul S. Wright, Peter N. Davis, Kevin Johnstone, Gert Rietveld, Andrew J. Roscoe. Field Measurement of Frequency and ROCOF in the Presence of Phase Steps
1696 -- 1704Jalen Stremfelj, Dusan Agrez. Estimation of the Power Quantities Below One Signal Period Using DFT Coefficients
1705 -- 1713Marjan Urekar, Nemanja Gazivoda, Abhilash Pejic. The Core for High-Precision Stochastic Smart Grid Meter Based on Low-Resolution Flash ADC
1714 -- 1723Lei Chen 0035, Wei Zhao, Fuping Wang, Qing Wang, Songling Huang. An Interharmonic Phasor and Frequency Estimator for Subsynchronous Oscillation Identification and Monitoring
1724 -- 1731Gabriella Crotti, Antonio Delle Femine, Daniele Gallo, Domenico Giordano, Carmine Landi, Mario Luiso. Measurement of the Absolute Phase Error of Digitizers
1732 -- 1739Gert Rietveld, Enrico Mohns, Ernest Houtzager, Henrik Badura, Dennis Hoogenboom. Comparison of Reference Setups for Calibrating Power Transformer Loss Measurement Systems
1740 -- 1747Ze Tang, Ju H. Park. Comparison of Two Methods for Phase Angle Measurement
1748 -- 1755Ryo Sakamaki, Masahiro Horibe. Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process
1756 -- 1764Sayaka Matsukawa, Satoru Kurokawa, Masanobu Hirose. Uncertainty Analysis of Far-Field Gain Measurement of DRGH Using the Single-Antenna Method and Amplitude Center Distance
1765 -- 1773Alessandro Sola, Vittorio Basso, Michaela Kuepferling, Massimo Pasquale, Daniel Carsten né Meier, Günter Reiss, Timo Kuschel, Takashi Kikkawa, Ken-ichi Uchida, Eiji Saitoh, Hyungyu Jin, Sarah J. Watzman, Steve Boona, Joseph Heremans, Matthias B. Jungfleisch, Wei Zhang, John E. Pearson, Axel Hoffmann, Hans W. Schumacher. Spincaloritronic Measurements: A Round Robin Comparison of the Longitudinal Spin Seebeck Effect
1774 -- 1780Masahiro Horibe, Seitaro Kon, Iku Hirano. Measurement Capability of Scanning Microwave Microscopy: Measurement Sensitivity Versus Accuracy
1781 -- 1787Hao Xu 0007, Weijun Liang, Qiulai Gao. A Self-Gap-Correction Method for Accurate Permittivity Measurement Using the Hybrid Optimization Algorithm
1788 -- 1795Yuto Kato, Masahiro Horibe. Improvement of Broadband Characterization of Dielectric Waveguide at the $Ka$ -Band by Using TRL Calibration Method
1796 -- 1805Yuto Kato, Masahiro Horibe. Broadband Permittivity Measurements up to 170-GHz Using Balanced-Type Circular-Disk Resonator Excited by 0.8-mm Coaxial Line
1806 -- 1813Miroslaw Miroslaw, Janusz Kaczmarek, Ryszard Rybski. Characterization of PXI-Based Generators for Impedance Measurement Setups
1814 -- 1820Ramonika Sengupta, Asha Adhiya, K. Satya Raja Sekhar, Rajwinder Kaur. Measurement of Complex Dielectric Constant Using Optical Method
1821 -- 1826Ryszard Rybski, Janusz Kaczmarek, Miroslaw Koziol, Marian Kampik. Errors of Multiplying D/A Converters Used for Precise AC Voltage Division
1827 -- 1832Ling Hao, John C. Gallop, Jie Chen 0016. Electromagnetic Metrology for Nano- Electromechanical Systems
1833 -- 1839Paul A. Williams, Alexandra B. Artusio-Glimpse, Joshua A. Hadler, Daniel W. King, Kyle A. Rogers, Ivan Ryger, Tam Vo, John H. Lehman. Radiation-Pressure-Enabled Traceable Laser Sources at CW Powers up to 50 kW
1840 -- 1843Anton Widarta. Null Technique for Precision RF Phase Shift Measurements
1844 -- 1851Yue Hu, Zijing Zeng, Jiangting Liu, Jianwen Wang, Weidong Zhang. Design of a Distributed UHF Sensor Array System for PD Detection and Location in Substation
1852 -- 1859Karel Drazil, Jan Grajciar, Tomas Pavlicek, Murat Celep, Martin Hudlicka. Harmonics Effects on Microwave Power Measurement Using Diode Sensors
1860 -- 1869Stanislav Maslan, Martin Sira, Tereza Skalicka, Tobias Bergsten. Four-Terminal Pair Digital Sampling Impedance Bridge up to 1MHz
1870 -- 1878Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist. Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards
1879 -- 1886Shigeki Mizushima, Naoki Kuramoto, Kenichi Fujii, Takahide Umeda. 28Si Single Crystal for the Future Realization of the Kilogram
1887 -- 1894Hansjörg Scherer, Dietmar Drung, Christian Krause 0004, Martin Götz, Ulrich Becker. Electrometer Calibration With Sub-Part-Per-Million Uncertainty
1895 -- 1900Yicheng Wang, Zhuang Fu, Mathieu Durand, Anne-Marie Jeffery. Nonlinearity of the NIST Calculable Capacitor
1901 -- 1906Marina Gertsvolf, Ghislain Granger. Calibration of Gigahertz Microwave Generator for the Programmable Josephson Voltage Standard at NRC
1907 -- 1912Yasutaka Amagai, Hiroyuki Fujiki, Kenjiro Okawa, Nobu-hisa Kaneko. Low-Frequency AC-DC Differences of a Series-Parallel Circuit of Thermal Converters
1913 -- 1920Naoki Kuramoto, Lulu Zhang, Kazuaki Fujita, Sho Okubo, Hajime Inaba, Kenichi Fujii. 28Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ
1921 -- 1926Hiroyuki Fujiki, Yasutaka Amagai, Kenjiro Okawa. Establishment of High-Voltage AC-DC Voltage Transfer Standards in 1-100-kHz Range at NMIJ
1927 -- 1934Dimitrios Georgakopoulos, Ilya Budovsky, Samuel P. Benz, Gleb Gubler. Josephson Arbitrary Waveform Synthesizer as a Reference Standard for the Measurement of the Phase of Harmonics in Distorted Waveforms
1935 -- 1940Dimitrios Georgakopoulos, Ilya Budovsky, Samuel P. Benz. AC Voltage Measurements to 120 V With a Josephson Arbitrary Waveform Synthesizer and an Inductive Voltage Divider
1941 -- 1947Dan Bee Kim, Dewi M. Kassim, Wan-Seop Kim, Luca Callegaro, Vincenzo D'Elia, Bruno Trinchera, Jan Kucera, Radek Sedlácek. Traceability Chain at KRISS from DC Quantum Hall Resistance to Farad Using Coaxial Bridges
1948 -- 1954Luca Oberto. Identification of RF&MW Microcalorimeter Weak Points by Means of Uncertainty Analysis
1955 -- 1960Branislav V. Djokic, Harold Parks. A Synchronized Current-Comparator Bridge for the Calibration of Analog Merging Units
1961 -- 1966Jianting Zhao, Yunfeng Lu, Changwei Zhai, Qing He, Xiaoding Huang, Yicheng Wang. Method for the Absolute Calibration of Direct-Current Current Transducers
1967 -- 1972No-Weon Kang, Jae-Yong Kwon, Chihyun Cho, Jeong-Il Park. Measurement System for Millimeter-Wave Antennas With Distributed External Local Oscillators and Mixers
1973 -- 1981Lushuai Qian, Zhonghua Zhang, Wei Zhao, Zhengkun Li, Zhuang Fu. A Disturbance Rejection Method for Beam Balance Oscillation Period Measurement
1982 -- 1989Vladimir Nesterov, Daniel Nies, Oleg Belai, Sebastian Bütefisch, Jürgen Kirchhoff, Michael Mueller, Uwe Brand. The Status of PTB's Nanonewton Force Facility
1990 -- 1995Kunli Zhou, Jifeng Qu, Jianting Zhao, Xun Xu, Yang Shi. Behavior Modeling of the Amplifier Nonlinearity With the AC Josephson Voltage Standard
1996 -- 2002Stephen P. Giblin, Dietmar Drung, Martin Götz, Hansjörg Scherer. Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty
2003 -- 2006Torsten Funck, Thomas Spiegel, Andreas Ihring. Planar Multijunction Thermal Converters With Increased Sensitivity Operated in Hermetically Sealed Housings Filled With Noble Gas
2007 -- 2014Marcelo B. Martins, Renata T. de Barros e Vasconcellos, Paulo A. A. Esquef. Models for Synchrophasor With Step Discontinuities in Magnitude and Phase: Estimation and Performance
2015 -- 2020Gordon A. Shaw, Julian Stirling. Measurement of Submilligram Masses Using Electrostatic Force
2021 -- 2026Tatsuji Yamada, Yasutaka Amagai, Seitaro Kon. A New Phase Difference Measurement System With Differential AC/Single-Ended DC Switching for One TVC
2027 -- 2033Martin Götz, Dietmar Drung, Christian Krause 0004, Ulrich Becker, Hansjörg Scherer. Calibrating Ultrastable Low-Noise Current Amplifiers of the Second Generation With a Cryogenic Current Comparator
2034 -- 2040Jussi Havunen, Jari Hallstrom. Application of Charge-Sensitive Preamplifier for the Calibration of Partial Discharge Calibrators Below 1 pC
2041 -- 2046Tobias Bergsten, Karl-Erik Rydler. Realization of Absolute Phase and AC Resistance of Current Shunts by Ratio Measurements
2047 -- 2052Tapio A. Lehtonen. Harmonic Power Standard of VTT MIKES
2053 -- 2059Zhaomin Shi, Jiangtao Zhang, Xianlin Pan, Ying Song, Jun Lin, Qing He. Self-Calibration and Verification of Phase Angle Errors of Two Voltage Dividers at High Frequencies
2060 -- 2065David Corminboeuf. Calibration of the Absolute Linearity of Lock-In Amplifiers
2066 -- 2071Jane Ireland, Jonathan M. Williams, Oliver F. Kieler, Ralf Behr, Ernest Houtzager, Ralph Hornecker, Helko E. van den Brom. An Optoelectronic Pulse Drive for Quantum Voltage Synthesizer
2072 -- 2077Michal Grzenik, Marian Kampik. Determination of AC-DC Transfer Difference of Calculable Thermal Voltage Converters in 1-30-MHz Frequency Range
2078 -- 2083Takayuki Abe, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko. Characterization of $1~\mathrm{k}\Omega$ Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1 $\Omega$ and $10~\Omega$ Standard Resistors
2084 -- 2090Helko E. van den Brom, Ronald van Leeuwen, Ralph Hornecker. Characterization of DC Current Sensors With AC Distortion for Railway Applications
2091 -- 2099Martin Sira, Oliver F. Kieler, Ralf Behr. A Novel Method for Calibration of ADC Using JAWS
2100 -- 2105Paolo Emilio Roccato, Pier Paolo Capra. Using High-Precision Multimeter Digitizer for High Short-Circuit Current Calibration
2106 -- 2112Jan Kucera, Pavel Svoboda, Klaus Pierz. AC and DC Quantum Hall Measurements in GaAs-Based Devices at Temperatures Up To 4.2 K
2113 -- 2120Sergey K. Khorshev, Alexander I. Pashkovsky, Artem N. Subbotin, Nina V. Rogozhkina, Yury M. Gryaznov, Maxim Yu Levichev, Evgeny E. Pestov, Mikhail A. Galin, Viktor Yu. Maksimov, Dmitry A. Zhezlov, Alexander S. Katkov, Alexander M. Klushin. Voltage Standard Based on Dry-Cooled High-Temperature Superconductor Josephson Junctions
2121 -- 2128Enrico Mohns, Chunyang Jiang, Henrik Badura, Peter Raether. A Fundamental Step-Up Method for Standard Voltage Transformers Based on an Active Capacitive High-Voltage Divider
2129 -- 2135Isaac Fan, Ralf Behr, Dietmar Drung, Christian Krause 0004, Martin Götz, Eckart Pesel, Hansjörg Scherer. Externally Referenced Current Source With Stability Down to 1 nA/A at 50 mA
2136 -- 2143Daniel Slomovitz, Marcelo Brehm, Daniel Izquierdo, Carlos Faverio, Jose Luis Casais, Marcelo H. Cazabat. Determination of Voltage Dependence in High-Voltage Standard Capacitors
2144 -- 2150Lu Huang, Yan Yang, Zuliang Lu, Jianting Zhao, Wei Wang 0182, Yunfeng Lu, Jianbo Wang, Qing He. Practical Application of Latest Optimal Hollow Active Auxiliary Electrode in Vertical Calculable Cross-Capacitor at NIM
2151 -- 2159Florin Lucian Constantin. Double-Resonance Two-Photon Spectroscopy of Hydrogen Molecular Ions for Improved Determination of Fundamental Constants
2160 -- 2167Thi Dao Pham, Djamel Allal, François Ziade, Eric Bergeault. On-Wafer Coplanar Waveguide Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz
2168 -- 2171Mauricio Sachica, Alexander Martinez. Analysis of Correlation in the Intercomparison of DC Voltage Reference Standards
2172 -- 2175Haji Ahmedov, Beste Korutlu, Recep Orhan. Optimization Procedure for the Determination of Faraday's Voltage in UME Kibble Balance (July 2018)
2176 -- 2182Leon S. Chao, Frank Seifert 0004, Darine Haddad, Julian Stirling, David B. Newell, Stephan Schlamminger. The Design and Development of a Tabletop Kibble Balance at NIST
2183 -- 2186Tetsuya Ido. Past and Future of Optical Clocks Toward Redefinition of the SI Second
2187 -- 2194Bryan C. Waltrip, Shannon Edwards, Tom L. Nelson, Mike Berilla. A Sampling Wattmeter With Extended Frequency Range
2195 -- 2200Dan Xu, Etienne Cantin, Florian Frank, Nicolas Quintin, Frederic Meynadier, Philip Tuckey, Anne Amy-Klein, Olivier Lopez, Paul-Eric Pottie. Two-Branch Fiber Link for International Clock Networks
2201 -- 2207Omer Erkan, Yakup Gulmez, Cem Hayirli, Gulay Gulmez, Enis Turhan. Reference Ultralow DC Current Source Between 1 fA and 100 pA at TÜBİTAK UME
2208 -- 2214Zhengkun Li, Yang Bai, Jinxin Xu, Qiang You, Dawei Wang, Zhonghua Zhang, Yunfeng Lu, Pengcheng Hu, Yongmeng Liu, Qing He, JiuBin Tan. The Improvements of the NIM-2 Joule Balance
2215 -- 2222Mohamed Ouameur, François Ziade, Yann Le Bihan. Toward a Calculable Standard Shunt for Current Measurements at 10 A and Up To 1 MHz
2223 -- 2228Marco Pisani, Andrea Malengo, Marco Santiano, Fabio Saba, Davide Torchio. A Simple Electrostatic Balance for the Milligram Range
2229 -- 2236Songling Huang, Lisha Peng, Qing Wang, Shen Wang, Wei Zhao. An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect
2237 -- 2245Yang Bai, Yunfeng Lu, Zhengkun Li, Pengcheng Hu, Zhonghua Zhang, Qing He. A Parasitic Displacement Measurement System for Suspended Coil in Joule Balance
2246 -- 2252Masato Wada, Sho Okubo, Ken Kashiwagi, Feng-Lei Hong, Kazumoto Hosaka, Hajime Inaba. Evaluation of Fiber Noise Induced in Ultrastable Environments
2253 -- 2259Kaori Hattori, Shuichiro Inoue, Ryo Kobayashi, Kazuki Niwa, Takayuki Numata, Daiji Fukuda. Optical Transition-Edge Sensors: Dependence of System Detection Efficiency on Wavelength
2260 -- 2267Joffray Guillory, Maylis Teyssendier de la Serve, Daniel Truong, Christophe Alexandre, Jean-Pierre Wallerand. Uncertainty Assessment of Optical Distance Measurements at Micrometer Level Accuracy for Long-Range Applications
2268 -- 2273Michael T. Hartman, Remy Battesti, Carlo Rizzo. Characterization of the Vacuum Birefringence Polarimeter at BMV: Dynamical Cavity Mirror Birefringence
2274 -- 2279Moto Kinoshita, Yuya Tojima, Hitoshi Iida. Frequency Extension of Atomic Measurement of Microwave Strength Using Zeeman Effect
2280 -- 2287Dazhen Gu, Xifeng Lu, Benjamin F. Jamroz, Dylan F. Williams, Xiaohai Cui, Aric W. Sanders. NIST-Traceable Microwave Power Measurement in a Waveguide Calorimeter With Correlated Uncertainties
2288 -- 2294Dazhen Gu, Jeffrey E. Jenkins. Noise Synthesis Technique in Time Domain for Metrology Application
2295 -- 2302Paul Struszewski, Mark Bieler. Asynchronous Optical Sampling for Laser-Based Vector Network Analysis on Coplanar Waveguides
2303 -- 2309Eva Kuhn, Arnold Nicolaus. Wavefront Aberration of Spheres With Local Deviations and Their Influence on the Radius Value