Journal: ACM Trans. Design Autom. Electr. Syst.

Volume 4, Issue 2

123 -- 193Christoph Kern, Mark R. Greenstreet. Formal verification in hardware design: a survey
194 -- 218Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang. BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults
219 -- 230Mitchell A. Thornton, V. S. S. Nair. Behavioral synthesis of combinational logic using spectral-based heuristics