Journal: IEEE Trans. Software Eng.

Volume 18, Issue 11

929 -- 930Richard W. Selby, Koji Torii. Guest Editorial Introduction: Special Issue on Software Measurement Principles, Techniques, and Environment
931 -- 942Lionel C. Briand, Victor R. Basili, William M. Thomas. A Pattern Recognition Approach for Software Engineering Data Analysis
943 -- 956Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong. Orthogonal Defect Classification - A Concept for In-Process Measurements
957 -- 968Stephen G. Eick, Joseph L. Steffen, Eric E. Sumner Jr.. Seesoft-A Tool For Visualizing Line Oriented Software Statistics
969 -- 979Yingsha Liao, Donald Cohen. A Specificational Approach to High Level Program Monitoring and Measuring
979 -- 987Taghi M. Khoshgoftaar, John C. Munson, Bibhuti B. Bhattacharya, Gary D. Richardson. Predictive Modeling Techniques of Software Quality from Software Measures
988 -- 997William W. Agresti, William M. Evanco. Projecting Software Defects From Analyzing Ada Designs
998 -- 1010Michael Daskalantonakis. A Practical View of Software Measurement and Implementation Experiences Within Motorola
1011 -- 1024Chris F. Kemerer, Benjamin S. Porter. Improving the Reliability of Function Point Measurement: An Empirical Study
1025 -- 1034Warren Harrison. An Entropy-Based Measure of Software Complexity