Journal: VLSI Design

Volume 1998, Issue 4

0 -- 0Parag K. Lala. Guest Editorial
313 -- 331Mark G. Karpovsky. Integrated On-Line and Off-Line Error Detection Mechanisms in the Coding Theory Framework
321 -- 336François Verdier, Bertrand Zavidovique. A High Level Synthesis System for VLSI Image Processing Applications
333 -- 345A. Morosow, V. V. Saposhnikov, Vl. V. Saposhnikov, Michael Gössel. Self-Checking Combinational Circuits with Unidirectionally Independent Outputs
337 -- 346Chittaranjan A. Mandal, Partha Pratim Chakrabarti, Sujoy Ghose. Complexity of Scheduling in High Level Synthesis
347 -- 356Steffen Tarnick. Embedded Parity and Two-Rail TSC Checkers with Error-Memorizing Capability
347 -- 352C. P. Ravikumar, Nikhil Sharma. Testability-Driven Layout of Combinational Circuits
353 -- 364Sudip Nag, Kaushik Roy 0001. Performance and Wirability Driven Layout for Row-Based FPGAs
357 -- 372Yeong-Ruey Shieh, Cheng-Wen Wu. Design of CMOS PSCD Circuits and Checkers for Stuck-At and Stuck-On Faults
365 -- 383Teofilo F. Gonzalez, Si-Qing Zheng. On Ensuring Multilayer Wirability by Stretching Layouts
373 -- 383Jien-Chung Lo. A Case Study of Self-Checking Circuits Reliability
385 -- 399Ray-I Chang, Pei-Yung Hsiao. Macro-Cell Placement for Custom-Chip Design Using Self-Organizing Fuzzy Technique
385 -- 392Feodor S. Vainstein. Self Checking Design Technique for Numerical Computations
401 -- 423Vincenza Carchiolo, Michele Malgeri, Giuseppe Mangioni. Formal Codesign Methodology with Multistep Partitioning
425 -- 436Dinesh P. Mehta. CLOTH MEASURE: A Software Tool for Estimating the Memory Requirements of Corner Stitching Data Structures