Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis

Fabian Vargas 0001, Eduardo Bezerra 0001, A. Terroso, Daniel Barros Jr.. Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis. In Proceedings of the 11th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998. pages 55-59, IEEE Computer Society, 1998. [doi]

Authors

Fabian Vargas 0001

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Eduardo Bezerra 0001

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A. Terroso

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Daniel Barros Jr.

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