Fabian Vargas 0001, Eduardo Bezerra 0001, A. Terroso, Daniel Barros Jr.. Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis. In Proceedings of the 11th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998. pages 55-59, IEEE Computer Society, 1998. [doi]
Abstract is missing.