Fabian Vargas 0001, Eduardo Bezerra 0001, A. Terroso, Daniel Barros Jr.. Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis. In Proceedings of the 11th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998. pages 55-59, IEEE Computer Society, 1998. [doi]
@inproceedings{00010TB98,
title = {Reliability Verification of Fault-Tolerant Systems Design based on Mutation Analysis},
author = {Fabian Vargas 0001 and Eduardo Bezerra 0001 and A. Terroso and Daniel Barros Jr.},
year = {1998},
url = {https://dl.acm.org/doi/10.5555/552517.829436},
researchr = {https://researchr.org/publication/00010TB98},
cites = {0},
citedby = {0},
pages = {55-59},
booktitle = {Proceedings of the 11th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998},
publisher = {IEEE Computer Society},
isbn = {0-8186-8704-5},
}