Binod Kumar 0001, Kanad Basu, Ankit Jindal, Brajesh Pandey, Masahiro Fujita. A Formal Perspective on Effective Post-silicon Debug and Trace Signal Selection. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 753-766, Springer, 2017. [doi]
Abstract is missing.