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A modern look at the CMOS stuck-open fault

Roberto Gómez 0001, Víctor H. Champac, Chuck Hawkins, Jaume Segura 0001. A modern look at the CMOS stuck-open fault. In 10th Latin American Test Workshop, LATW 2009, Rio de Janeiro, Brazil, March 2-5, 2009. pages 1-6, IEEE, 2009. [doi]

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