Importance sampling measured BRDFs based on second order spherical moment

Jie Guo 0001, Yanwen Guo, Jingui Pan. Importance sampling measured BRDFs based on second order spherical moment. In Diego Gutierrez, Hui Huang 0004, editors, SIGGRAPH Asia 2017 Posters, Bangkok, Thailand, November 27 - 30, 2017. ACM, 2017. [doi]

Authors

Jie Guo 0001

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Yanwen Guo

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Jingui Pan

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