Jie Guo 0001, Yanwen Guo, Jingui Pan. Importance sampling measured BRDFs based on second order spherical moment. In Diego Gutierrez, Hui Huang 0004, editors, SIGGRAPH Asia 2017 Posters, Bangkok, Thailand, November 27 - 30, 2017. ACM, 2017. [doi]
@inproceedings{0001GP17,
title = {Importance sampling measured BRDFs based on second order spherical moment},
author = {Jie Guo 0001 and Yanwen Guo and Jingui Pan},
year = {2017},
doi = {10.1145/3145690.3145698},
url = {http://doi.acm.org/10.1145/3145690.3145698},
researchr = {https://researchr.org/publication/0001GP17},
cites = {0},
citedby = {0},
booktitle = {SIGGRAPH Asia 2017 Posters, Bangkok, Thailand, November 27 - 30, 2017},
editor = {Diego Gutierrez and Hui Huang 0004},
publisher = {ACM},
isbn = {978-1-4503-5405-9},
}