Amit Agarwal 0001, Steven Hsu, Simeon Realov, Mark Anders, Gregory K. Chen, Monodeep Kar, Raghavan Kumar, Huseyin Sumbul, Phil C. Knag, Himanshu Kaul, Sanu Mathew, Mahesh Kumashikar, Ram Krishnamurthy, Vivek De. 25.7 Time-Borrowing Fast Mux-D Scan Flip-Flop with On-Chip Timing/Power/VMIN Characterization Circuits in 10nm CMOS. In 2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020. pages 392-394, IEEE, 2020. [doi]
@inproceedings{0001HRACKKSKKMK20,
title = {25.7 Time-Borrowing Fast Mux-D Scan Flip-Flop with On-Chip Timing/Power/VMIN Characterization Circuits in 10nm CMOS},
author = {Amit Agarwal 0001 and Steven Hsu and Simeon Realov and Mark Anders and Gregory K. Chen and Monodeep Kar and Raghavan Kumar and Huseyin Sumbul and Phil C. Knag and Himanshu Kaul and Sanu Mathew and Mahesh Kumashikar and Ram Krishnamurthy and Vivek De},
year = {2020},
doi = {10.1109/ISSCC19947.2020.9062941},
url = {https://doi.org/10.1109/ISSCC19947.2020.9062941},
researchr = {https://researchr.org/publication/0001HRACKKSKKMK20},
cites = {0},
citedby = {0},
pages = {392-394},
booktitle = {2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3205-1},
}