Binod Kumar 0001, Ankit Jindal, Jaynarayan T. Tudu, Brajesh Pandey, Virendra Singh. Revisiting random access scan for effective enhancement of post-silicon observability. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 132-137, IEEE, 2017. [doi]
Abstract is missing.