Chengyu Zhang 0001, Minquan Sun, Jianwen Li, Ting Su 0001, Geguang Pu. Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. In IEEE/ACM International Conference On Computer Aided Design, ICCAD 2021, Munich, Germany, November 1-4, 2021. pages 1-9, IEEE, 2021. [doi]
Abstract is missing.