Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns

Sebastian Huhn 0001, Daniel Tille, Rolf Drechsler. Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-2, IEEE, 2019. [doi]

@inproceedings{0001TD19,
  title = {Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns},
  author = {Sebastian Huhn 0001 and Daniel Tille and Rolf Drechsler},
  year = {2019},
  doi = {10.1109/ETS.2019.8791508},
  url = {https://doi.org/10.1109/ETS.2019.8791508},
  researchr = {https://researchr.org/publication/0001TD19},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1173-5},
}