Chang Liu 0010, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich. Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 92-97, IEEE, 2018. [doi]
@inproceedings{0010SKHW18,
title = {Extending Aging Monitors for Early Life and Wear-Out Failure Prevention},
author = {Chang Liu 0010 and Eric Schneider and Matthias Kampmann and Sybille Hellebrand and Hans-Joachim Wunderlich},
year = {2018},
doi = {10.1109/ATS.2018.00028},
url = {https://doi.org/10.1109/ATS.2018.00028},
researchr = {https://researchr.org/publication/0010SKHW18},
cites = {0},
citedby = {0},
pages = {92-97},
booktitle = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
publisher = {IEEE},
isbn = {978-1-5386-9466-4},
}