Chang Liu 0010, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich. Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 92-97, IEEE, 2018. [doi]
Abstract is missing.