Reliable ultra-low voltage cache with variation-tolerance

Cheng Li 0011, Meilin Zhang, Paul Ampadu. Reliable ultra-low voltage cache with variation-tolerance. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 121-124, IEEE, 2013. [doi]

Abstract

Abstract is missing.