Najwa Aaraj, Anis Nazer, Ali Chehab, Ayman I. Kayssi. Transient Current Testing of Dynamic CMOS Circuits. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 264-271, IEEE Computer Society, 2004. [doi]
Abstract is missing.