Zia Abbas, Andleeb Zahra, Mauro Olivieri. LEADER: Leakage Currents Estimation Technique for Aging Degradation Aware 16 nm CMOS Circuits. In S. Rajaram, N. B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh, editors, VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. Volume 892 of Communications in Computer and Information Science, pages 394-407, Springer, 2018. [doi]
Abstract is missing.