True non-intrusive sensors for RF built-in test

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir. True non-intrusive sensors for RF built-in test. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-10, IEEE Computer Society, 2013. [doi]

Abstract

Abstract is missing.