Optimization-based multifrequency test generation for analog circuits

Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny. Optimization-based multifrequency test generation for analog circuits. J. Electronic Testing, 9(1-2):59-73, 1996. [doi]

Authors

Abdessatar Abderrahman

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Bozena Kaminska

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Eduard Cerny

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