Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny. Optimization-based multifrequency test generation for analog circuits. J. Electronic Testing, 9(1-2):59-73, 1996. [doi]
@article{AbderrahmanKC96,
title = {Optimization-based multifrequency test generation for analog circuits},
author = {Abdessatar Abderrahman and Bozena Kaminska and Eduard Cerny},
year = {1996},
doi = {10.1007/BF00137565},
url = {http://dx.doi.org/10.1007/BF00137565},
tags = {optimization, rule-based, testing},
researchr = {https://researchr.org/publication/AbderrahmanKC96},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {9},
number = {1-2},
pages = {59-73},
}