Built-in Self Test Based on Multiple On-Chip Signature Checking

Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar. Built-in Self Test Based on Multiple On-Chip Signature Checking. J. Electronic Testing, 14(3):227-244, 1999. [doi]

Authors

Mohammed Fadle Abdulla

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C. P. Ravikumar

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Anshul Kumar

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