Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar. Built-in Self Test Based on Multiple On-Chip Signature Checking. J. Electronic Testing, 14(3):227-244, 1999. [doi]
@article{AbdullaRK99,
title = {Built-in Self Test Based on Multiple On-Chip Signature Checking},
author = {Mohammed Fadle Abdulla and C. P. Ravikumar and Anshul Kumar},
year = {1999},
doi = {10.1023/A:1008310203790},
url = {http://dx.doi.org/10.1023/A:1008310203790},
tags = {rule-based, testing, C++},
researchr = {https://researchr.org/publication/AbdullaRK99},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {14},
number = {3},
pages = {227-244},
}