Test generation for path-delay faults in one-dimensional iterative logic arrays - researchr publication authors

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Nabil M. Abdulrazzaq, Sandeep K. Gupta. Test generation for path-delay faults in one-dimensional iterative logic arrays. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 326-335, IEEE Computer Society, 2000.

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