Nabil M. Abdulrazzaq, Sandeep K. Gupta. Test generation for path-delay faults in one-dimensional iterative logic arrays. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 326-335, IEEE Computer Society, 2000.
@inproceedings{AbdulrazzaqG00,
title = {Test generation for path-delay faults in one-dimensional iterative logic arrays},
author = {Nabil M. Abdulrazzaq and Sandeep K. Gupta},
year = {2000},
tags = {testing, logic},
researchr = {https://researchr.org/publication/AbdulrazzaqG00},
cites = {0},
citedby = {0},
pages = {326-335},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}