Path-Delay Fault Simulation for Circuits with Large Numbers of Paths for Very Large Test Sets - researchr publication authors

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Nabil M. Abdulrazzaq, Sandeep K. Gupta. Path-Delay Fault Simulation for Circuits with Large Numbers of Paths for Very Large Test Sets. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 186-196, IEEE Computer Society, 2003. [doi]

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