10-year reliability test results for SC connector installed on outside plant

Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase. 10-year reliability test results for SC connector installed on outside plant. IEICE Electronic Express, 6(8):472-476, 2009. [doi]

Authors

Yoshiteru Abe

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Shuichi Yanagi

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Shuichiro Asakawa

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Ryo Nagase

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