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Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase. 10-year reliability test results for SC connector installed on outside plant. IEICE Electronic Express, 6(8):472-476, 2009. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: 20-year Reliability Test Results for SC Connector Installed on Outside PlantYoshiteru Abe, Kota Shikama, Shuichiro Asakawa, Shuichi Yanagi. ofc 2018: 1-3 [doi]
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