Jaume Abella, Xavier Vera, Osman S. Unsal, Oguz Ergin, Antonio González. Fuse: A Technique to Anticipate Failures due to Degradation in ALUs. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 15-22, IEEE Computer Society, 2007. [doi]
@inproceedings{AbellaVUEG07,
title = {Fuse: A Technique to Anticipate Failures due to Degradation in ALUs},
author = {Jaume Abella and Xavier Vera and Osman S. Unsal and Oguz Ergin and Antonio González},
year = {2007},
doi = {10.1109/IOLTS.2007.34},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.34},
researchr = {https://researchr.org/publication/AbellaVUEG07},
cites = {0},
citedby = {0},
pages = {15-22},
booktitle = {13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece},
publisher = {IEEE Computer Society},
}