Jaume Abella, Xavier Vera, Osman S. Unsal, Oguz Ergin, Antonio González. Fuse: A Technique to Anticipate Failures due to Degradation in ALUs. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 15-22, IEEE Computer Society, 2007. [doi]
Abstract is missing.