David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman. DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 14, IEEE Computer Society, 2006. [doi]
@inproceedings{AbercrombieKTV06,
title = {DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield},
author = {David Abercrombie and Bernd Koenemann and Nagesh Tamarapalli and Srikanth Venkataraman},
year = {2006},
doi = {10.1109/VLSID.2006.73},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.73},
tags = {debugging},
researchr = {https://researchr.org/publication/AbercrombieKTV06},
cites = {0},
citedby = {0},
pages = {14},
booktitle = {19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}