DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield - researchr publication

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David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman. DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 14, IEEE Computer Society, 2006. [doi]

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