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Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-constrained IoT Edge Devices

Geancarlo Abich, Ricardo Augusto da Luz Reis, Luciano Ost. Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-constrained IoT Edge Devices. In IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. pages 207-216, IEEE, 2024. [doi]

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