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Modelling of through silicon via and devices electromagnetic coupling

Mohamed Abouelatta-Ebrahim, Rabah Dahmani, Olivier Valorge, Francis Calmon, Christian Gontrand. Modelling of through silicon via and devices electromagnetic coupling. Microelectronics Journal, 42(2):316-324, 2011. [doi]

Authors

Mohamed Abouelatta-Ebrahim

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Rabah Dahmani

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Olivier Valorge

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Francis Calmon

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Christian Gontrand

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