Mohamed Abouelatta-Ebrahim, Rabah Dahmani, Olivier Valorge, Francis Calmon, Christian Gontrand. Modelling of through silicon via and devices electromagnetic coupling. Microelectronics Journal, 42(2):316-324, 2011. [doi]
@article{Abouelatta-EbrahimDVCG11,
title = {Modelling of through silicon via and devices electromagnetic coupling},
author = {Mohamed Abouelatta-Ebrahim and Rabah Dahmani and Olivier Valorge and Francis Calmon and Christian Gontrand},
year = {2011},
doi = {10.1016/j.mejo.2010.10.017},
url = {http://dx.doi.org/10.1016/j.mejo.2010.10.017},
researchr = {https://researchr.org/publication/Abouelatta-EbrahimDVCG11},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {42},
number = {2},
pages = {316-324},
}