Armin Haj Aboutalebi, Ethan C. Ahn, Bo Mao, Suzhen Wu, Lide Duan. Mitigating and Tolerating Read Disturbance in STT-MRAM-Based Main Memory via Device and Architecture Innovations. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(12):2229-2242, 2019. [doi]
Abstract is missing.