Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda. Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players?. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-2, IEEE, 2014. [doi]
Abstract is missing.