Miron Abramovici, David T. Miller, Rabindra K. Roy. Dynamic redundancy identification in automatic test generation. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 466-469, IEEE, 1989. [doi]
@inproceedings{AbramoviciMR89, title = {Dynamic redundancy identification in automatic test generation}, author = {Miron Abramovici and David T. Miller and Rabindra K. Roy}, year = {1989}, doi = {10.1109/ICCAD.1989.76992}, url = {http://dx.doi.org/10.1109/ICCAD.1989.76992}, researchr = {https://researchr.org/publication/AbramoviciMR89}, cites = {0}, citedby = {0}, pages = {466-469}, booktitle = {1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers}, publisher = {IEEE}, isbn = {0-8186-1986-4}, }