Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab. On Selecting Flip-Flops for Partial Reset. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 1008-1012, IEEE Computer Society, 1993.
Abstract is missing.