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A Novel Model for Injecting Error in Probabilistic Gates

Mohamed A. K. Abuelala, Amr Wassal, Ahmed Khattab, Hossam A. H. Fahmy. A Novel Model for Injecting Error in Probabilistic Gates. In 31st International Conference on Microelectronics, ICM 2019, Cairo, Egypt, December 15-18, 2019. pages 276-279, IEEE, 2019. [doi]

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Mohamed A. K. Abuelala

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Amr Wassal

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Ahmed Khattab

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Hossam A. H. Fahmy

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