Mohamed A. K. Abuelala, Amr Wassal, Ahmed Khattab, Hossam A. H. Fahmy. A Novel Model for Injecting Error in Probabilistic Gates. In 31st International Conference on Microelectronics, ICM 2019, Cairo, Egypt, December 15-18, 2019. pages 276-279, IEEE, 2019. [doi]
@inproceedings{AbuelalaWKF19,
title = {A Novel Model for Injecting Error in Probabilistic Gates},
author = {Mohamed A. K. Abuelala and Amr Wassal and Ahmed Khattab and Hossam A. H. Fahmy},
year = {2019},
doi = {10.1109/ICM48031.2019.9021520},
url = {https://doi.org/10.1109/ICM48031.2019.9021520},
researchr = {https://researchr.org/publication/AbuelalaWKF19},
cites = {0},
citedby = {0},
pages = {276-279},
booktitle = {31st International Conference on Microelectronics, ICM 2019, Cairo, Egypt, December 15-18, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4058-2},
}