Mohamed A. K. Abuelala, Amr Wassal, Ahmed Khattab, Hossam A. H. Fahmy. A Novel Model for Injecting Error in Probabilistic Gates. In 31st International Conference on Microelectronics, ICM 2019, Cairo, Egypt, December 15-18, 2019. pages 276-279, IEEE, 2019. [doi]
Abstract is missing.