Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan. Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
Abstract is missing.