Mustafa Acar, Anne-Johan Annema, Bram Nauta. Digital Detection of Oxide Breakdown and Life-Time Extension in Submicron CMOS Technology. In 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008. pages 530-531, IEEE, 2008. [doi]
Abstract is missing.