Leakage and leakage sensitivity computation for combinational circuits

Emrah Acar, Anirudh Devgan, Rahul M. Rao, Ying Liu, Haihua Su, Sani R. Nassif, Jeffrey L. Burns. Leakage and leakage sensitivity computation for combinational circuits. In Ingrid Verbauwhede, Hyung Roh, editors, Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003, Seoul, Korea, August 25-27, 2003. pages 96-99, ACM, 2003. [doi]

@inproceedings{AcarDRLSNB03,
  title = {Leakage and leakage sensitivity computation for combinational circuits},
  author = {Emrah Acar and Anirudh Devgan and Rahul M. Rao and Ying Liu and Haihua Su and Sani R. Nassif and Jeffrey L. Burns},
  year = {2003},
  doi = {10.1145/871506.871532},
  url = {http://doi.acm.org/10.1145/871506.871532},
  researchr = {https://researchr.org/publication/AcarDRLSNB03},
  cites = {0},
  citedby = {0},
  pages = {96-99},
  booktitle = {Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003, Seoul, Korea, August 25-27, 2003},
  editor = {Ingrid Verbauwhede and Hyung Roh},
  publisher = {ACM},
  isbn = {1-58113-682-X},
}